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Facilities Scanning electron microscope with focused ion beam (FIB_SEM)

Scanning electron microscope with focused ion beam (FIB_SEM)

Advanced material science and engineeringConnectivityNatural SciencesSocial sciences and humanities
LOCATION
Technical University of Madrid (UPM)
Centre for biomedical technology
Description
The FIB-SEM equipment consists of a scanning electron microscope (SEM) capable of taking high-resolution images and a focused ion beam (FIB) that can be used to remove successive layers of the sample. The model is ZEISS Crossbeam 540.

Way(s) of collaboration

Sharing rules are available here: https://www.upm.es/recursosidi/infraestructura/microscopio-electronico-de-barrido-con-canon-de-iones-focalizados-fib-sem/Please read this document to know the sharing rules


GUSTAVO VICTOR GUINEA TORTUERO
Responsable
Grupo: Materiales Estructurales Avanzados y Nanomateriales; Centro/int: Centro de Tecnología Biomédica CTB
Technical University of Madrid (UPM)

Get in contact
Type
A scientific or technological infrastructure
Activities
Research, Teaching, and others (industrial...) activities
Load
Unknown
Frequently asked question
Can I put my facility in the catalogue?
Yes, if you are from one of the EELISA member, you can log in and create a page for your facility. It will be then validated by a dedicated person at your institution and published. You can edit it at any time.

What happens when I am contacted?
The catalogue is meant to get in touch and start scientific discussion. There is no obligation to accept the collaboration.

Whom to contact if I would like to get more information about the catalogue ?
Each insitution has at least one contact :

I am from UPM, may I publish on the catalogue?
As UPM has its own local catalogue ( ), you first need to publish your facility on the UPM catalogue and then it will be transferred to the EELISA catalogue with no further action from your side.