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Facilities Scanning electron microscope with focused ion beam (FIB-SEM)

Scanning electron microscope with focused ion beam (FIB-SEM)

Advanced material science and engineeringDigitalizationHealthNatural Sciences
LOCATION
Technical University of Madrid (UPM)
Center for Biomedical Technology
Description
The FIB-SEM equipment consists of a scanning electron microscope (SEM) capable of taking high-resolution images and a focused ion beam (FIB) that can be used to remove successive layers of the sample. The model is ZEISS Crossbeam 540.
Way(s) of collaboration

Please read this document to know the sharing rules

GUSTAVO VICTOR GUINEA TORTUERO
Responsable
Grupo: Materiales Estructurales Avanzados y Nanomateriales; Centro/int: Centro de Tecnología Biomédica CTB
Technical University of Madrid (UPM)
Get in contact
Type
A scientific or technological infrastructure
More information
https://www.upm.es/recursosidi/infraestructura/microscopio-electronico-de-barrido-con-canon-de-iones-focalizados-fib-sem/
Frequently asked question
Can I put my facility in the catalogue?
Yes, if you are from one of the EELISA member, you can log in and create a page for your facility. It will be then validated by a dedicated person at your institution and published. You can edit it at any time.
What happens when I am contacted?
The catalogue is meant to get in touch and start scientific discussion. There is no obligation to accept the collaboration.
Whom to contact if I would like to get more information about the catalogue ?
Each insitution has at least one contact :
I am from UPM, may I publish on the catalogue?
As UPM has its own local catalogue ( ), you first need to publish your facility on the UPM catalogue and then it will be transferred to the EELISA catalogue with no further action from your side.